Description
TP20
Allows the use of a range of stylus configurations and
extensions to access features on complex parts.
SF – Standard force: XY: 0.08N I Z: 0.75N I Stylus: 10mm
LF – Low force: XY: 0.055N I Z: 0.65N I Stylus: 10mm
MF – Medium force: XY: 0.1N I Z: 1.9N I Stylus: 25mm
EF – Extended force: XY: 0.1N I Z: 3.2N I Stylus: 50mm
6W – 6-way: XY: 0.14N I Z: 1.6N I Stylus: 10mm
EM1 STD – 50mm extension: XY: 0.08N I Z: 0.75N I Stylus: 10mm
EM2 STD – 75mm extension: XY: 0.08 N I Z: 0.75N I Stylus: 10mm
TP200/TP200B
3 Modules Available
SF (Standard Force)
LF (Low Force)
EO (Extended Overtravel)
The TP200 and TP200B are electronic probes using strain gauge technology, which gives higher accuracy than kinematic touch-trigger probes. They combine outstanding metrology performance with superior functionality to produce a highly versatile DCC CMM probing system, with excellent productivity.
SP25M
At only 25mm in diameter, and with a range of scanning and touch-trigger modules, the SP25M is
the world’s most compact and versatile scanning probe system.
